Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes Tektronix TICP series IsoVu™ probes IsoVu™ Isolated Current Probes

Tektronix TICP series IsoVu™ probes

IsoVu™ Isolated Current Probes

Varunummer: Tektronix TICP

Tektronix TICP IsoVu™ Isolated Current Probes

TICP Series IsoVuTM Isolated Current Probes make accurate, low-noise, dynamic current measurements using shunt and current viewing resistors, even in the presence of fast-changing common mode voltages that occur on floating devices in power circuits.  Available with three bandwidths - 1 GHz, 500 MHz, and 250 MHz - the TICP Series is compatible with Tektronix 4, 5 and 6 Series MSO oscilloscopes, including the latest B models.

Complete galvanic isolation eliminates ground loops and enables very high common mode rejection with common mode voltage rating of 1000 V CAT II; Pollution degree 2 (see datasheet for additional information).  In a 1X configuration, the probe measures ±0.5 V range and its 50 O input offers extremely low noise of less than 150 µVRMS at 1 GHz – ideal for measuring low voltage drops on current shunts. Different attenuation tips are available to extend the differential voltage range. Depending upon the shunt used, these probes can perform current measurements from microamperes (uA) for low-power mobile design, to hundreds of amperes for industrial and mobility systems.

Specifications

  • Product range: TICP025, TICP050, TICP100
  • Bandwidth: 250 MHz, 500 MHz, 1 GHz
  • Max Common Mode Voltage: 1800 V; 1000 V CAT II
  • Dynamic Range and Max Voltage (1X): +/- 0.5V
  • Dynamic Range and Max Voltage (10X): +/- 5 V
  • Common Mode Rejection Ratio (CMRR): 140 dB at DC; up to 90 dB at 1 MHz
  • Cable Length: 2 m (78 in.)
  • Standard warranty: 1 year

Key applicastions

  • Current shunt measurements
  • Half/Full bridge designs using SiC or GaN, FETs or IGBTs
  • Double pulse testing (DPT)
  • Floating gate measurements
  • Power converter designs
  • Switching power supply design
  • Steady state, sleep and wake-up state current monitoring